Statistical inversion approach for optimizing current patterns in EIT
Not for data collection
Publication channel information
Title of host publication
Proceedings of 3rd World Congress on Industrial Process Tomography
Publisher
The Virtual Centre for Industrial Process Tomography
Internationality
Yes
Detailed publication information
Publication year
2003
Journal/series volume number
-1
Page numbers
683-688
Language of publication
English
Co-publication information
International co-publication
No
Classification and additional information
Additional information
Banff, Canada 2.-5.9.2003,