Statistical inversion approach for optimizing current patterns in EIT

Not for data collection

Publication information

OKM publication type

A4

Category

Artikkelit ja abstraktit

Sub category

Artikkelit ja abstraktit tieteellisissä konferenssijulkaisuissa

Type

Full Paper

Refereed

Kyllä

Authors of the publication

Authors

Kaipio JP, Seppänen A, Somersalo E, Haario H

Local authors

Unit

Ei laitostietoa

Publication channel information

Title of host publication

Proceedings of 3rd World Congress on Industrial Process Tomography

Publisher

The Virtual Centre for Industrial Process Tomography

Internationality

Yes

Detailed publication information

Publication year

2003

Journal/series volume number

-1

Page numbers

683-688

Language of publication

English

Co-publication information

International co-publication

No

Classification and additional information

Additional information

Banff, Canada 2.-5.9.2003,