Rigorous and approximate analysis of metallic gratings in soft X-ray and EUV regions

Not for data collection

Classifications

MinEdu publication type
A3 Book chapter (peer-reviewed)
Category
Artikkelit ja abstraktit
Refereed
Kyllä
Sub category
Artikkelit tieteellisissä kokoomateoksissa
Type
Alkuperäisartikkeli

Authors of the publication

Authors
Tuomas Vallius;Pasi Vahimaa and Jari Turunen
Local authors
Author
Vallius Tuomas
Author
Turunen Jari

Publication channel information

Title of host publication
Photon Management
Title of journal/series
Proceedings of SPIE : the International Society for Optical Engineering
ISSN (print)
0277-786X
ISSN (electronic)
1996-756X
ISSN (linking)
0277-786X
Publisher
SPIE
Publication forum ID
71479
Internationality
Yes

Detailed publication information

Publication year
2004
Page numbers
327-332
Language of publication
English

Co-publication information

International co-publication
No