Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics
Approved
Publication information
OKM publication type
A4
Category
Artikkelit ja abstraktit
Sub category
Artikkelit ja abstraktit tieteellisissä konferenssijulkaisuissa
Type
Full Paper
Refereed
Kyllä
Publication channel information
Title of host publication
Optical Micro- and Nanometrology IV
Editors of host publication
Christophe Gorecki, Anand K Asundi, Wolfgang Osten
ISBN (print)
-
Title of journal/series
Proceedings of SPIE : the International Society for Optical Engineering
ISSN (print)
0277-786X
ISSN (electronic)
1996-756X
ISSN (linking)
0277-786X
Publisher
SPIE
Publication forum ID
71479
Publication forum level
1
Country of publication
Belgium
Internationality
Yes
Detailed publication information
Publication year
2012
Reporting year
2012
Page numbers
84300K
DOI
10.1117/12.922443
Co-publication information
International co-publication
Yes
Classification and additional information
MinEdu field of science classification
114 Physical sciences