Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics

OKM publication type

A4

Category

Artikkelit ja abstraktit

Sub category

Artikkelit ja abstraktit tieteellisissä konferenssijulkaisuissa

Type

Full Paper

Refereed

Kyllä

Number of authors

7

Authors

Czajkowski J, Lauri J, Sliz R, Fält P, Fabritius T, Myllylä R, Cense B

Title of host publication

Optical Micro- and Nanometrology IV

Editors of host publication

Christophe Gorecki, Anand K Asundi, Wolfgang Osten

ISBN (print)

-

Title of journal/series

Proceedings of SPIE : the International Society for Optical Engineering

Publisher

SPIE

Publication forum ID

71479

Publication forum level

1

Country of publication

Belgium

Internationality

Yes

Publication year

2012

Reporting year

2012

Page numbers

84300K

DOI

10.1117/12.922443